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FLX2320-R Automated Stress Measurement System

FLX Series

Precision Surface Stress Analysis

With thermal cycling and ambient auto-rotation models available, the Toho FLX Thin Film Stress Measurement Systems offer Industry Standard capabilities for mass production and research facilities that demand accurate stress measurements on various films and substrates. Incorporating KLA-Tencor’s patented “Dual Wavelength” technology, Toho FLX Series tools precisely determine and analyze surface stress caused by deposited thin films.
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HL9900 Hall Effect Measurement

Toho HL9900

Hall Effect Measurement

HL9900 is a turnkey, high performance hall effect system for the measurement of resistivity, carrier concentration, and mobility in semiconductors. Modular in concept, allowing easy upgrade paths, the system is suitable for a wide variety of materials, including silicon and compound semiconductors. HL9900 has both low and high resistivity measurement capabilities.

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Meridian Adhesives Group Acquires Adhesive/Dispensing-Related Business

We would like to inform you that the "Adhesive/Dispensing" business of the John P. Kummer Group has been acquired by the Meridian Adhesives Group and will in due course be merged into Epoxy Technology Europe GmbH.

While you will have continued access to the EPO-TEK product line, we are pleased to offer the expanded product portfolio of the Meridian Adhesives Group in the near future.

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COVID-19 Information

Dear Valued Customers and Business Partners
 
Our companies are following the current recommendations from respective national and local governments related to alleviating the spread of Coronavirus. We have established a policy and guidelines with regards to travel as well as leisure activities and personal hygiene.
 
This also means that our employees will be modifying their work patterns for the time being – we have asked that employees where possible should work from home.
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40 Years

Today the John P. Kummer GmbH has its 40th anniversary.
We want to thank all our business partners who have accompanied us on our way to get a successful and trusting company!
Special thanks to our customers for your trust and longterm cooperation!
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DOUBLE-SIDED WAFER PROBERS

Our range of double-sided probing systems is designed for wafer sizes up to 200 mm (8″) and is ideal for testing power semiconductor devices such as MOSFETs and IGBTs at wafer level. We offer a choice of fully automatic and semi-automatic double-sided wafer probe stations. Both can be customized to suit a wide range of probing applications.

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